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Shared Devices

Shared Devices

Shared Devices List

FE-SEM (field emission‐type scanning electron microscope & energy dispersive X-ray analyzer), high-speed ion milling system, EPMA-EDX (electron probe microanalyzer, energy dispersive X-ray analyzer), SEM (scanning electron microscope), general-purpose NC lathe, radial drilling machine, wire electrical discharge machine, machining center, CNC external cylindrical grinding machine, glass lathe, high speed precision cutting machine, high speed precision lathe, multi-purpose drilling machine, Digimatic Height Gage set, UV ozone cleaner, nano-scale genetic analyzer system, water purification system, hand-held lapping tool for rough grinding/polishing

Knowledge based Medical Device Cluster / Miyagi Area ICR

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